Beilstein J. Nanotechnol.2020,11, 147–166, doi:10.3762/bjnano.11.13
; nanoparticlemodeling; size effects; Introduction
It is not possible to simultaneously observe and manipulate a nanoparticle using atomic force microscopy (AFM) as the imaging and manipulation tools are combined. As a result, dynamic modeling and simulation are essential in this field of research. For the
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Figure 1:
Schematic of the manipulation process of a cylindrical nanoparticle by means of AFM.